Microscopic structures of amorphous Ge2Sb2Te5 films, electrically phase-changed using co-planar electrodes, have been studied through electrical and structural investigations. Microscope images show a structured phase-change region consisting of a narrow channel, banks on both sides, and rough peripheral regions. The room-temperature resistivity is ∼10-3 Ω·cm, which has a metallic temperature dependence. Micro-Raman scattering spectra at the channel and the bank exhibit peaks due to crystalline Te and tellurides. X-ray diffraction patterns from the films, which contain many channels, present crystalline peaks ascribable to cubic GeTe and other compounds. These observations suggest that the Ge2Sb2Te5 melt is liable to phase-separate under electrical self-heating.