Abstract
In this work, the track etch-rate VT and etch-rate ratio V of CR-39 detector irradiated by alpha particles was investigated at different incident angles. The change of the track etch-rate and etch-rate ratio along the particle trajectories showed that these functions are not affected by the inclination of the particle trajectory with respect to the normal on the detector surface.
Export citation and abstract BibTeX RIS
Content from this work may be used under the terms of the Creative Commons Attribution 3.0 licence. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI.