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Studying radiation hardness of a cadmium tungstate crystal based radiation detector

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Published under licence by IOP Publishing Ltd
, , Citation M M Shtein et al 2016 IOP Conf. Ser.: Mater. Sci. Eng. 135 012042 DOI 10.1088/1757-899X/135/1/012042

1757-899X/135/1/012042

Abstract

The given article considers radiation hardness of an X-ray detector used in production of non-destructive testing instruments and inspection systems. In the course of research, experiments were carried out to estimate radiation hardness of a detector based on cadmium tungstate crystal and its structural components individually. The article describes a layout of an experimental facility that was used for measurements of radiation hardness. The radiation dose dependence of the photodiode current is presented, when it is excited by a light flux of a scintillator or by an external light source. Experiments were carried out to estimate radiation hardness of two types of optical glue used in detector production; they are based on silicon rubber and epoxy. With the help of a spectrophotometer and cobalt gun, each of the glue samples was measured for a relative light transmission factor with different wavelengths, depending on the radiation dose. The obtained data are presented in a comprehensive analysis of the results. It was determined, which of the glue samples is most suitable for production of detectors working under exposure to strong radiation.

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10.1088/1757-899X/135/1/012042