Abstract
We studied the degradation of different types of bulk heterojunction devices, in which the materials comprising the active layer and/or the materials used for the back electrode are varied. The devices are deposited on ITO covered glass and have the structure PEDOT:PSS/BHJ/Me, where PEDOT:PSS is the hole transport layer, BHJ (bulk heterojunction) is the active layer comprising a polymer donor (e.g. PTB7, PCDTBT) and a fullerene derivative acceptor (e.g. PC60BM, PC70BM) deposited by spin coating, Me is the metal back contact, which is either Ag or Al deposited by magnetron sputtering or thermal evaporation. The device performance was monitored after storage in the dark at ambient conditions by following the evolution of the J-V curve over time. Results of real conditions outdoor degradation studies are also presented. The stability of the different solar cell structures studied is compared.
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