Issues

Latest issues

(complete)

• Number 16, 2018

  Wearable Sensors and Systems 1 -and- Microfabricated and Nanofabricated Systems for MEMS/NEMS 14

• Number 15, 2018

  Chemical Sensors 14: Chemical and Biological Sensors and Analytical Systems Editor(s): A. Simonian, B. A. Chin, R. I. Stefan-van Staden, P. Vanýsek, S. Mitra, M. Bayachou, R. Mukundan, P. Chen, A. H. Suroviec

• Number 14, 2018

  Molten Salts and Ionic Liquids 21 Editor(s): W. M. Reichert, R. A. Mantz, P. C. Trulove, L. M. Haverhals, E. J. Biddinger, H. C. De Long, A. H. Suroviec, M. Mizuhata, M. Ueda, A. Ispas, A. Bund, D. P. Durkin

• Number 13, 2018

  Polymer Electrolyte Fuel Cells and Electrolyzers 18 (PEFC&E18)

• Number 12, 2018

  Gallium Nitride and Silicon Carbide Power Technologies 8 Editor(s): M. Dudley, M. Bakowski, K. Shenai, N. Ohtani, B. Raghothamachar

• Number 11, 2018

  Thin Film Transistor Technologies 14 (TFTT 14) Editor(s): Y. Kuo

• Number 10, 2018

  High Purity and High Mobility Semiconductors 15 Editor(s): E. Simoen, O. Kononchuk, O. Nakatsuka, C. Claeys

• Number 9, 2018

  State-of-the-Art Program on Compound Semiconductors 61 (SOTAPOCS 61) – and – Low-Dimensional Nanoscale Electronic and Photonic Devices 11

• Number 8, 2018

  Materials, Formulation, and Processes for Semiconductor, 2.5 and 3D Chip Packaging, and High Density Interconnection PCB Editor(s): W. P. Dow, G. Mathad, K. Kondo, M. Hayase, M. Koyanagi, F. Roozeboom, R. Akolkar, S. Armini, Y. Takeno, L. Wei

• Number 7, 2018

  SiGe, Ge, and Related Materials: Materials, Processing, and Devices 8 Editor(s): Q. Liu, J. M. Hartmann, A. Thean, S. Miyazaki, A. Ogura, X. Gong, M. Caymax, A. Schulze, G. Masini, A. Mai, M. Ostling, G. Niu, D. L. Harame

• Number 6, 2018

  Atomic Layer Deposition Applications 14 Editor(s): F. Roozeboom, S. De Gendt, J. W. Elam, J. Dendooven, O. van der Straten, C. Liu, A. Illiberi

• Number 5, 2018

  Semiconductor Wafer Bonding: Science, Technology, and Applications 15 Editor(s): C. S. Tan, T. Suga, H. Baumgart, F. Fournel, M. S. Goorsky, K. D. Hobart, R. Knechtel

• Number 4, 2018

  Electrochemical Engineering General Session–and–Characterization of Electrochemical Reactors: Fluid Dynamics and Current Distribution Editor(s): J. A. Staser, D. P. Riemer, J. L. Nava

• Number 3, 2018

  Nonvolatile Memories 6-and-Surface Characterization and Manipulation for Electronic Applications Editor(s): S. Shingubara, Z. Karim, K. Kobayashi, B. Magyari-Kope, H. Shima, Y. Saito, J. G. Park, G. Bersuker, H. Kubota, C. A. Hacker, Y. S. Obeng

• Number 2, 2018

  Semiconductors, Dielectrics, and Metals for Nanoelectronics 16 Editor(s): D. Misra, S. De Gendt, S. Dayeh, K. Kita

• Number 1, 2018

  Pits & Pores 8: Nanomaterials – Fabrication, Properties, and Applications Editor(s): P. Granitzer, R. Boukherroub, D. J. Lockwood, H. Masuda, S. Virtanen