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The Japan Society of Applied Physics

The Japan Society of Applied Physics (JSAP) serves as an academic interface between science and engineering and an interactive platform for academia and the industry. JSAP is a "conduit" for the transfer of fundamental concepts to the industry for development and technological applications.

JSAP was established as an official academic society in 1946, and since then, it has been one of the leading academic societies in Japan. The society's interests cover a broad variety of scientific and technological fields, and JSAP continues to explore state-of-the-art and interdisciplinary topics.

To this end, the JSAP holds annual conferences; publishes scientific journals; actively sponsors events, symposia, and festivals related to science education; and compiles information related to state-of-the-art technology for the public.

FOREWORD

Atomically Controlled Surfaces, Interfaces and Nanostructures/Scanning Probe Microscopy

Published 17 July 2019 © 2019 The Japan Society of Applied Physics
, , Citation 2019 Jpn. J. Appl. Phys. 58 SI0001

1347-4065/58/SI/SI0001

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On behalf of the organizing committee of the 14th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ACSIN-14) and the 26th International Colloquium on Scanning Probe Microscopy (ICSPM26) held at Sendai, Japan, from October 21 to 25, 2018, we are very pleased to publish the special issue on Atomically Controlled Surfaces, Interfaces and Nanostructures/Scanning Probe Microscopy.

The ACSIN series originate in the first International Symposium on Atomically Controlled Surfaces and Interfaces held in 1991 by the Thin Film and Surface Physics Division in The Japan Society of Applied Physics. With the development of nanoscience and nanotechnology in mind, the word "Nanostructures" has been added to the name of the conference since the fifth conference in 1999. The host country of ACSIN has been determined based on a policy of continental rotation among Asia, Europe and America every two years.

On the other hand, the ICSPM series was established in 1985 as a domestic meeting of the Thin Film and Surface Physics Division, The Japan Society of Applied Physics, and was extended to an international scale in 1993. Its purpose is to collect the newest research outputs related to scanning probe microscopy (SPM) techniques from wide variety of fields and to promote mutual understanding of researchers in the community.

In consideration of further development of nanoscience and technology, the organizing committee has decided to hold these two conferences together to strengthen their relations and meet the needs of the times in 2018. The present conference accommodated 637 participants from 20 countries, and the participants enjoyed 542 papers in total, including 7 plenary talks, 45 invited talks, 145 contributed oral talks and 345 posters.

The present special issue contains 64 papers, including two Progress Reviews written by the invited speakers and 62 Regular Papers from the contributed presenters. We sincerely hope this special issue will accelerate further progress in the related fields by inspiring the readers of this journal.

At last, we, the publication committee of this special issue, would like to express our sincere gratitude to all the authors and reviewers for their contributions.

Publication Committee for the Special Issue of ACSIN-14 & ICSPM26

GUEST EDITORS

Takuji Takahashi (The University of Tokyo)

Daisuke Fujita (National Institute for Materials Science)

Hirokazu Fukidome (Tohoku University)

Ken-ichi Fukui (Osaka University)

Hiroki Hibino (Kwansei Gakuin University)

Masami Kageshima (Osaka Electro-Communication University)

Tadahiro Komeda (Tohoku University)

Ken Nakajima (Tokyo Institute of Technology)

Makoto Nakamura (Fujitsu)

Tomonobu Nakayama (National Institute for Materials Science)

Hiroshi Nohira (Tokyo City University)

Kaoru Sasakawa (University of Tsukuba)

Naruo Sasaki (The University of Electro-Communications)

Koji Sumitomo (University of Hyogo)

Takayuki Uchihashi (Nagoya University)

Takanobu Watanabe (Waseda University)

Yoichi Yamada (University of Tsukuba)

10.7567/1347-4065/ab2864