Microcalorimeter/EBIT Measurements of X-ray Spectra of Highly Charged Ions

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Published under licence by IOP Publishing Ltd
, , Citation I Kink et al 2001 Phys. Scr. 2001 454 DOI 10.1238/Physica.Topical.092a00454

1402-4896/2001/T92/454

Abstract

Spectra of highly charged Ar, Kr, Xe and Fe ions, produced in an Electron Beam Ion Trap (EBIT), have been recorded in a broad X-ray energy band (0.2 keV to 10 keV) with a microcalorimeter detector. The first analysis of the Kr spectra has been completed and most of the spectral lines have been identified as transitions of B- to Al-like Kr. Line intensity ratios of Fe XVII have been measured and compared with theoretical models.

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10.1238/Physica.Topical.092a00454