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(Invited) Charge-Localization in Doped Semiconducting Carbon Nanotubes Revealed By IR- and EPR Spectroscopy

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© 2020 ECS - The Electrochemical Society
, , Citation Klaus H Eckstein et al 2020 Meet. Abstr. MA2020-01 717 DOI 10.1149/MA2020-017717mtgabs

2151-2043/MA2020-01/7/717

Abstract

IR and EPR spectroscopic investigations of redox- p-doped semiconducting (6,5) single-wall carbon nanotubes (s-SWNTs) were used to study carrier localization and delocalization from low- up to degenerate doping levels. At low carrier concentrations, the analysis of IR-intraband transitions as well as the appearance of a doping-induced vibrational D-band anti-resonance, point to charge-localization on the few nm length-scale. Moreover, the rise of a spin 1/2 signal in EPR closely tracks the increase of the doping level, supporting the notion of charge-localization at low carrier concentrations. At doping levels exceeding 0.1 nm-1, EPR data as well as intra- and D-band absorption in the IR point to antiferromagnetic coupling between surplus charge carriers becoming dominant. These results are expected to be relevant for field- or redox-chemical doping of s-SWNTs in any polarizable, heterogeneous environment.

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10.1149/MA2020-017717mtgabs