Active Trap Determination at the Interface of Ge and In_xGa_1-xAs Substrates with Dielectric Layers

Alessandro Molle¹, Silvia Baldovino¹, Luca Lamagna¹, Sabina Spiga¹, Marco Fanciulli¹, Dimitra Tsoutsou², Evangelos Golias², Athanasios Dimoulas², Guy Brammertz³, Clement Merckling³ and Matty Caymax³

© 2011 ECS - The Electrochemical Society
ECS Meeting Abstracts, Volume MA2011-02, E4 - High Dielectric Constant and Other Dielectric Materials for Nanoelectronics and Photonics 9 Citation Alessandro Molle et al 2011 Meet. Abstr. MA2011-02 1899 DOI 10.1149/MA2011-02/27/1899