Selective Epitaxy of Si and SiGe for Future MOS Devices

© 2009 ECS - The Electrochemical Society
, , Citation Ichiro Mizushima 2009 ECS Trans. 22 81 DOI 10.1149/1.3152964

1938-5862/22/1/81

Abstract

Selective epitaxial growth of Si and SiGe films has been applied to the fabrication of many high-performance MOSFETs, because new device structures can be realized by selective epitaxial growth. Selective growth of Si and SiGe at the source/drain region is the most well-known example. Selective growth on S/D region is especially important for FinFETs, which is one of the most promising candidate for future MOS devices. By using selective epitaxy of Si:C, precise device design can be realized. Multi-stacked structure, which is also a candidate for next-generation devices, can be fabricated with SiGe epitaxial growth.

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10.1149/1.3152964