Relating Microstructure to Surface Exchange Kinetics Using in Situ Optical Absorption Relaxation

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© 2017 ECS - The Electrochemical Society
, , Citation Ting Chen et al 2017 ECS Trans. 75 23 DOI 10.1149/07543.0023ecst

1938-5862/75/43/23

Abstract

SrTi0.65Fe0.35O3-δ (STF35) thin films grown by pulsed laser deposition were applied as a model system to explore the impact of microstructure on oxygen surface exchange kinetics, of importance for solid oxide cell electrodes. The impact of growth temperature on crystalline quality, orientation, grain size, and surface roughness was evaluated. A contact-free, continuous, in situ Optical Transmission Relaxation (OTR) approach was applied to quantify the films' native surface oxygen exchange coefficients (kchem). In situ crystallization was used to obtain fast surface exchange kinetics via a dynamic nanostructuring process.

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