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The Japan Society of Applied Physics, find out more

The Japan Society of Applied Physics

The Japan Society of Applied Physics (JSAP) serves as an academic interface between science and engineering and an interactive platform for academia and the industry. JSAP is a "conduit" for the transfer of fundamental concepts to the industry for development and technological applications.

JSAP was established as an official academic society in 1946, and since then, it has been one of the leading academic societies in Japan. The society's interests cover a broad variety of scientific and technological fields, and JSAP continues to explore state-of-the-art and interdisciplinary topics.

To this end, the JSAP holds annual conferences; publishes scientific journals; actively sponsors events, symposia, and festivals related to science education; and compiles information related to state-of-the-art technology for the public.

Phase Tomography by X-ray Talbot Interferometry for Biological Imaging

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Published 8 June 2006 • Copyright (c) 2006 The Japan Society of Applied Physics
, , Citation Atsushi Momose et al 2006 Jpn. J. Appl. Phys. 45 5254

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Author affiliations

1 Department of Advanced Materials Science, School of Frontier Sciences, The University of Tokyo, 5-1-5 Kashiwanoha, Kashiwa, Chiba 277-8561, Japan

2 Graduate School of Pure and Applied Sciences, University of Tsukuba, 1-1-1 Tennodai, Tsukuba, Ibaraki 305-8573, Japan

3 Japan Synchrotron Radiation Research Institute, 1-1-1 Kouto, Sayo, Hyogo 679-5198, Japan

4 Laboratory of Advanced Science and Technology for Industry, University of Hyogo, 3-1-2 Kouto, Kamigori, Hyogo 678-1205, Japan

Dates

Received 13 December 2005
Accepted 5 March 2006
Published

DOI

https://doi.org/10.1143/JJAP.45.5254

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1347-4065/45/6R/5254

Abstract

The X-ray phase tomography of biological samples is reported, which is based on X-ray Talbot interferometry. Its imaging principle is described in detail, and imaging results obtained for a cancerous rabbit liver and a mouse tail with synchrotron radiation are presented. Because an amplitude grating is needed to construct an X-ray Talbot interferometer, a high-aspect-ratio grating pattern was fabricated by X-ray lithography and gold electroplating. X-ray Talbot interferometry has an advantage that it functions with polychromatic cone-beam X-rays. Finally, the compatibility with a compact X-ray source is discussed.

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10.1143/JJAP.45.5254