Abstract
The characteristics of ZnSe-based laser diodes grown on GaAs and ZnSe substrates are discussed. There is no significant difference observed in the dynamic behavior and in the operating voltages between the two cases. The degradation mechanism is similar with the developing of dark line defects and a 1/t-like decrease in light intensity at constant current for t →∞. The width of the dark line defects is in homoepitaxy almost constant in time, although their number is higher. This difference is also reflected in the lifetimes of our devices during lasing, which is in heteroepitaxy three minutes and about one second in homoepitaxy, for both in cw operation at room temperature.