In Situ Electron-Beam Processing for GaAs/AlGaAs Nanostructure Fabrications

Copyright (c) 1996 The Japan Society of Applied Physics
, , Citation Tomonori Ishikawa Tomonori Ishikawa 1996 Jpn. J. Appl. Phys. 35 5583 DOI 10.1143/JJAP.35.5583

1347-4065/35/11R/5583

Abstract

The requirements for the fabrication technology of 2-dimensional and/or 3-dimensional nanometer-scale heterostructures with III–V compound semiconductors are described. In addition to a fabrication capability with nanometer accuracy, the processes must avoid both undesirable contaminations and any damage effect. To meet these requirements, we have developed in situ electron-beam (EB) processing in which all of the processes, including EB lithography, pattern etching and epitaxial overgrowth, are performed successively in an ultra-high vacuum-based environment. The present status of this technique, i.e. nanometer-scale patterning, cleanliness of the processed surfaces and damage-free characteristics, is discussed. It is also demonstrated that self-organized epitaxy, which is now being intensively studied, can be combined with in situ EB processing as an elemental process.

Export citation and abstract BibTeX RIS

Please wait… references are loading.
10.1143/JJAP.35.5583