Measurement of Temperature Dependence of Dielectric Permittivity of Sapphire Window for High Power Gyrotrons

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Copyright (c) 1996 The Japan Society of Applied Physics
, , Citation Koji Takahashi et al 1996 Jpn. J. Appl. Phys. 35 4413 DOI 10.1143/JJAP.35.4413

1347-4065/35/8R/4413

Abstract

It was measured that the dielectric permittivity of sapphire window changed with temperature rise at the frequencies of 110.0 GHz and 170.0 GHz. The permittivity ε varied from 9.4 to 10.0 at 170.0 GHz with temperature rise from 300 K to 630 K, which can cause a significant rf reflection at the surface of the window and degrade gyrotron oscillation. The permittivity change should be considered for the window design of high power, long pulse gyrotrons and transmission.

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10.1143/JJAP.35.4413