In-plane Orientation and Coincidence Site Lattice Relation of Bi2Sr2CaCu2Ox Thin Films Formed on Highly Mismatched (001) YAG Substrates

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Copyright (c) 1994 The Japan Society of Applied Physics
, , Citation Masayuki Kataoka et al 1994 Jpn. J. Appl. Phys. 33 929 DOI 10.1143/JJAP.33.929

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Author affiliations

1 Semiconductor Research Laboratory, Mitsubishi Electric Coporarion, Tsukaguchi-Honmachi, Amagasaki, Hyogo 661

2 Materials and Electronic Devices Laboratory, Mitsubishi Electric Corporation, Tsukaguchi-Honmachi, Amagasaki, Hyogo 661

Dates

  1. Received 8 September 1993
  2. Accepted 20 November 1993

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1347-4065/33/1S/929

Abstract

The symmetry-related in-plane misorientation is investigated in an highly mismatched system of (001) Bi2Sr2CaCu2Ox(2212) thin films on (001) cubic substrates with 12 Å lattice length. Irregular in-plane orientation of 2212[510]// Sub.[120] is expected on the basis of the coincidence site lattice theory. This expectation is realized using (001)YAG (yttrium aluminium garnet) substrates. The atomic structure model is shown with regard to the interface between (001)2212 film and the (001)YAG surface.

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10.1143/JJAP.33.929