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Low Energy Electron Diffraction and X-Ray Photoelectron Spectroscopy Studies of the Formation of Submonolayer Interfaces of Sb/Si(111)

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Copyright (c) 1988 The Japan Society of Applied Physics
, , Citation Chong-Yun Park et al 1988 Jpn. J. Appl. Phys. 27 147 DOI 10.1143/JJAP.27.147

1347-4065/27/1R/147

Abstract

Surface reconstructions of a submonolayer Sb/Si(111) system were investigated by low-energy electron diffraction and X-ray photoelectron spectroscopy. It has been found that the surface superstructures of diffuse 2×2 (or three-domain 2×1), √3×√3, 5√3×5√3 and 7√3×7√3 are formed for the Sb coverages around one monolayer.

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10.1143/JJAP.27.147