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Nonparametric algorithm of electronic components test data pattern recognition

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Published under licence by IOP Publishing Ltd
, , Citation N V Koplyarova et al 2019 IOP Conf. Ser.: Mater. Sci. Eng. 537 042021 DOI 10.1088/1757-899X/537/4/042021

1757-899X/537/4/042021

Abstract

The paper discusses the quality diagnostics of electrical radio components based on the results of non-destructive testing. A proposed clustering algorithm does not require preliminary information on the number of classes and the training sample. The algorithm allows to automatically determine the number of classes. The division into classes is due to the different characteristics of the measured variables, which correspond to different product quality ranges.

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10.1088/1757-899X/537/4/042021