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Recovery of small orientation gradients in a recrystallized grain observed in 3D during ex-situ annealing

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, , Citation Chuanshi Hong et al 2022 IOP Conf. Ser.: Mater. Sci. Eng. 1249 012050 DOI 10.1088/1757-899X/1249/1/012050

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cshong@imr.ac.cn

doje@mek.dtu.dk

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1 Department of Civil and Mechanical Engineering, Technical University of Denmark, DK-2800 Kgs Lyngby, Denmark

2 Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, China

3 Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois, 60439, USA

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1757-899X/1249/1/012050

Abstract

We report the observation of a small orientation gradient (~0.5° over a few micrometers) in a recrystallized grain formed at the sample surface in pure Al and the elimination of this orientation gradient during subsequential ex-situ annealing. The observation is in 3D and done using synchrotron white-beam differential-aperture X-ray microscopy with high angular resolution of 0.01°. The elimination of the orientation gradient during subsequent annealing are analyzed and discussed.

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10.1088/1757-899X/1249/1/012050