Single event upsets in the ATLAS IBL frontend ASICs

Published 5 November 2019 © 2019 IOP Publishing Ltd and Sissa Medialab
, , The 9th International Workshop on Semiconductor Pixel Detectors for Particles and Imaging Citation Y. Takubo 2019 JINST 14 C11004 DOI 10.1088/1748-0221/14/11/C11004

1748-0221/14/11/C11004

Abstract

Single event effects like Single Event Upset (SEU) and Single Event Transient (SET) are big concerns in detector operation in high radiation environment. The single event effects are being more visible in the operation of the ATLAS Insertable B-Layer (IBL) located on the 3.3 cm radius from the beam pipe, as the instantaneous luminosity at the LHC increases. In this paper, studies of single event effects on the front-end ASICs used for the IBL detector will be described.

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10.1088/1748-0221/14/11/C11004