Abstract
Single event effects like Single Event Upset (SEU) and Single Event Transient (SET) are big concerns in detector operation in high radiation environment. The single event effects are being more visible in the operation of the ATLAS Insertable B-Layer (IBL) located on the 3.3 cm radius from the beam pipe, as the instantaneous luminosity at the LHC increases. In this paper, studies of single event effects on the front-end ASICs used for the IBL detector will be described.