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The thickness dependence of dielectric permittivity in thin films

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Published under licence by IOP Publishing Ltd
, , Citation Ivan A Starkov and Alexander S Starkov 2016 J. Phys.: Conf. Ser. 741 012004 DOI 10.1088/1742-6596/741/1/012004

1742-6596/741/1/012004

Abstract

It is well known that the physical properties of thin films depend on their thickness. For a description of such dependences, it is proposed to use a classical model taking into account the presence of film interfaces. A dielectric ball near the half-space was chosen to adopt the approach. The dependence of the effective permittivity of the ball on geometrical and physical parameters of the system is analyzed. It is demonstrated that the dielectric constant of a film can be presented as a sum of the constant of a bulk material and the interface term.

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10.1088/1742-6596/741/1/012004