Paper The following article is Open access

Quality Inspection of Gluing in Narrow Border Based on Depth Map

, , and

Published under licence by IOP Publishing Ltd
, , Citation Xiang Zou et al 2021 J. Phys.: Conf. Ser. 1820 012132 DOI 10.1088/1742-6596/1820/1/012132

1742-6596/1820/1/012132

Abstract

To solve the problem of glue breakage and overflow in the packaging process of mobile phones, a glue detection algorithm based on the depth map is proposed. By collecting the image no gluing and gluing after dispensing, the pixel value of each frame in the corresponding position of the corresponding sample is sequentially intercepted in the same sample, and the glue contour is reconstructed by rearranging the intercepted ROI. Last, measure the width and height information of the glue according to the contour, and judge the defect problem at the same time. Experimental results show that the algorithm can accurately measure the result of the micron-level glue, and accurately determine the lack of glue. At the same time, the measurement accuracy of the algorithm is 0.01mm, and the measurement results are accurate and stable.

Export citation and abstract BibTeX RIS

Content from this work may be used under the terms of the Creative Commons Attribution 3.0 licence. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI.

Please wait… references are loading.
10.1088/1742-6596/1820/1/012132