Optimization of the acid leaching process by using an ultrasonic field for metallurgical grade silicon

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2009 Chinese Institute of Electronics
, , Citation Zhang Jian et al 2009 J. Semicond. 30 053002 DOI 10.1088/1674-4926/30/5/053002

1674-4926/30/5/053002

Abstract

In the experiment, acid leaching under an ultrasonic field (20 kHz, 80 W) was used to remove Al, Fe, and Ti impurities in metallurgical grade silicon (MG-Si). The effects of the acid leaching process parameters, including the particle size of silicon, the acid type (HCl, HNO3, HF,) and the leaching time on the purification of MG-Si were investigated. The results show that HCl leaching, an initial size of 0.1 mm for the silicon particles, and 8 h of leaching time are the optimum parameters to purify MG-Si. The acid leaching process under an ultrasonic field is more effective than the acid leaching under magnetic stirring, the mechanism of which is preliminarily discussed.

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10.1088/1674-4926/30/5/053002