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Pulsed laser deposition of YBCO films on ISD MgO buffered metal tapes

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Published 17 February 2003 Published under licence by IOP Publishing Ltd
, , Citation B Ma et al 2003 Supercond. Sci. Technol. 16 464 DOI 10.1088/0953-2048/16/4/308

0953-2048/16/4/464

Abstract

Biaxially textured magnesium oxide (MgO) films deposited by inclined-substrate deposition (ISD) are desirable for rapid production of high-quality template layers for YBCO-coated conductors. High-quality YBCO films were grown on ISD MgO buffered metallic substrates by pulsed laser deposition (PLD). Columnar grains with a roof-tile surface structure were observed in the ISD MgO films. X-ray pole figure analysis revealed that the (002) planes of the ISD MgO films are tilted at an angle from the substrate normal. A small full-width at half maximum (FWHM) of ≈9° was observed in the ϕ-scan for ISD MgO films deposited at an inclination angle of 55°. In-plane texture in the ISD MgO films developed in the first ≈0.5 μm from the substrate surface, and then stabilized with further increases in film thickness. Yttria-stabilized zirconia and ceria buffer layers were deposited on the ISD MgO grown on metallic substrates prior to the deposition of YBCO by PLD. YBCO films with the c-axis parallel to the substrate normal have a unique orientation relationship with the ISD MgO films. An orientation relationship of YBCO⟨100⟩∥MgO⟨111⟩ and YBCO⟨010⟩∥MgO⟨110⟩ was measured by x-ray pole figure analyses and confirmed by transmission electron microscopy. A Tc of 91 K with a sharp transition and transport Jc of 5.5 × 105 A cm−2 at 77 K in self-field were measured on a YBCO film that was 0.46 μm thick, 4 mm wide and 10 mm long.

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10.1088/0953-2048/16/4/308