TOPICAL REVIEW

Optics of high-performance electron microscopes*

Published 21 April 2008 2008 National Institute for Materials Science
, , Citation H H Rose 2008 Sci. Technol. Adv. Mater. 9 014107 DOI 10.1088/0031-8949/9/1/014107

1468-6996/9/1/014107

Abstract

During recent years, the theory of charged particle optics together with advances in fabrication tolerances and experimental techniques has lead to very significant advances in high-performance electron microscopes. Here, we will describe which theoretical tools, inventions and designs have driven this development. We cover the basic theory of higher-order electron optics and of image formation in electron microscopes. This leads to a description of different methods to correct aberrations by multipole fields and to a discussion of the most advanced design that take advantage of these techniques. The theory of electron mirrors is developed and it is shown how this can be used to correct aberrations and to design energy filters. Finally, different types of energy filters are described.

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