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Theory of spectral line profile analysis with reflection echelon

Published under licence by IOP Publishing Ltd
, , Citation V P Nayyar 1971 J. Phys. D: Appl. Phys. 4 489 DOI 10.1088/0022-3727/4/4/303

0022-3727/4/4/489

Abstract

The response of a pressure scanned reflection echelon to a Voigt profile (Doppler-broadened Lorentzian) is expressed analytically. The effects of surface imperfections of the echelon plates and the finite width of the exploring diaphragm on L-D determination of a spectral line are considered.

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10.1088/0022-3727/4/4/303