Abstract
Shot noise was observed in the electric transport in uniform MEM(TCNQ)2, MEtM(TCNQ)2 and MBtM(TCNQ)2. The shot noise occurred in the ohmic regime. The mean distances that the charge carriers travel between trapping events are larger than the lengths of the samples ( approximately 3 mm). An explanation in terms of solitons with charges +or-1/2e is proposed. Although the soliton picture is, at this stage, rather speculative, it appears to be the only charge-transport mechanism currently to be found in the literature that is compatible with the experimental results. In MEtM(TCNQ)2 and MBtM(TCNQ)2 two conduction mechanisms were found, but the precise nature of these mechanisms and their interactions could not be revealed.