We report the development of a pulsed inductive microwave
magnetometer for measurements of ultra-fast magnetization dynamics
of soft magnetic thin films. This paper details the instrument
construction and the measurement procedure. We show experimentally
that our instrument detects nanosecond and sub-nanosecond
magnetization precession/relaxation processes, in real time,
without the need for data averaging, interpolation or any other
post-measurement data processing. This enhanced detection
resolution has been achieved by careful design and optimization of
the coplanar waveguide, which will be described in detail in this
paper. Moreover, we show that, unlike other similar instruments,
our apparatus is significantly simplified, reducing the cost as
well as the measurement procedure.