The starting formula of Bosvieux and Friedel (J. Phys. Chem. Solids, 23 (1962) 123) for the force on an ion in a metal
due to an applied voltage is shown to lead to the same description
as the linear-response approach used in the field since its
introduction by Kumar and Sorbello (Thin Solid Films, 25 (1975) 25). By this
electromigration theory has become a unified theory. This follows after
accounting for a treacherous trap term, which at first sight
seems to be zero. Up to now,
Bosvieux and Friedel claimed to predict a completely screened
direct force, which means that only a wind force would be operative.
In addition, the amount of screening has been calculated up to
second order in the potential of the migrating impurity,
using a finite temperature version of the screening term derived by Sham (Phys. Rev. B, 12 (1975) 3142).
For a proton in a metal modeled as a jellium the screening
appears to be about 15%, which is neither negligible nor
reconcilable with the old full-screening point of view.