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IOPcollections

These special collections provide instant access to IOP articles chosen for their quality and recency. Use the filters to refine your results for each collection.



1 of 2


  • Focus section on graphene modelling: morphology, defect mechanics and growth

    V B Shenoy

    2011 Modelling Simul. Mater. Sci. Eng. 19 050201 doi:10.1088/0965-0393/19/5/050201

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  • Ductile processes at aluminium crack tips: comparison of orbital-free density functional theory with classical potential predictions

    Linda Hung and Emily A Carter

    2011 Modelling Simul. Mater. Sci. Eng. 19 045002 doi:10.1088/0965-0393/19/4/045002

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  • New algorithms for discrete dislocation modeling of fracture

    Srinath S Chakravarthy and William A Curtin

    2011 Modelling Simul. Mater. Sci. Eng. 19 045009 doi:10.1088/0965-0393/19/4/045009

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  • Screw dislocation mobility in BCC metals: the role of the compact core on double-kink nucleation

    P A Gordon, T Neeraj, Y Li and J Li

    2010 Modelling Simul. Mater. Sci. Eng. 18 085008 doi:10.1088/0965-0393/18/8/085008

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  • Focus section on interface modelling

    2010 Modelling Simul. Mater. Sci. Eng. 18 070201 doi:10.1088/0965-0393/18/7/070201

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  • A three-dimensional model of electromigration and stress induced void nucleation in interconnect structures

    N Singh, A F Bower and S Shankar

    2010 Modelling Simul. Mater. Sci. Eng. 18 065006 doi:10.1088/0965-0393/18/6/065006

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  • Utilizing the meso-scale grain boundary stress to estimate the onset of delamination in 2099-T861 aluminium–lithium

    Russell J McDonald and Armand J Beaudoin

    2010 Modelling Simul. Mater. Sci. Eng. 18 065007 doi:10.1088/0965-0393/18/6/065007

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  • A geometric approach to modeling microstructurally small fatigue crack formation: II. Physically based modeling of microstructure-dependent slip localization and actuation of the crack nucleation mechanism in AA 7075-T651

    J D Hochhalter, D J Littlewood, R J Christ Jr, M G Veilleux, J E Bozek, A R Ingraffea and A M Maniatty

    2010 Modelling Simul. Mater. Sci. Eng. 18 045004 doi:10.1088/0965-0393/18/4/045004

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  • Focus issue on contact and friction modelling

    2010 Modelling Simul. Mater. Sci. Eng. 18 030201 doi:10.1088/0965-0393/18/3/030201

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  • Automated detection and characterization of microstructural features: application to eutectic particles in single crystal Ni-based superalloys

    M A Tschopp, M A Groeber, R Fahringer, J P Simmons, A H Rosenberger and C Woodward

    2010 Modelling Simul. Mater. Sci. Eng. 18 025014 doi:10.1088/0965-0393/18/2/025014

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1 of 2



  1. Bias spectroscopy and simultaneous single-electron transistor charge state detection of Si:P double dots

    M Mitic et al 2008 Nanotechnology 19 265201

  2. Competition between glass transition and liquid–gas separation in attracting colloids

    A M Puertas et al 2007 J. Phys.: Condens. Matter 19 205140

  3. Blackbody-radiation shift in a 88Sr+ ion optical frequency standard

    Dansha Jiang et al 2009 J. Phys. B: At. Mol. Opt. Phys. 42 154020

  4. Comparison of thermal properties predicted by interatomic potential models

    Seunghwa Ryu and Wei Cai 2008 Modelling Simul. Mater. Sci. Eng. 16 085005

  5. The response of silicon detectors to low-energy ion implantation

    T Hopf et al 2008 J. Phys.: Condens. Matter 20 415205

  6. The atomic charge distribution in glasses obtained by terahertz spectroscopy

    S N Taraskin et al 2007 J. Phys.: Condens. Matter 19 455216

  7. Transport spectroscopy of a single atom in a FinFET

    G P Lansbergen et al 2008 J. Phys.: Conf. Ser. 109 012003

  8. Visualization of thermally activated nanocarriers using in situ atomic force microscopy

    Mingdong Dong et al 2007 Nanotechnology 18 185501

  9. Time optimal quantum evolution of mixed states

    Alberto Carlini et al 2008 J. Phys. A: Math. Theor. 41 045303

  10. Energy gap measurement of nanostructured aluminium thin films for single Cooper-pair devices

    N A Court et al 2008 Supercond. Sci. Technol. 21 015013



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