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Tomographic x-ray absorption spectroscopy

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Published under licence by IOP Publishing Ltd
, , Citation C G Schroer et al 2005 Phys. Scr. 2005 1026 DOI 10.1238/Physica.Topical.115a01026

1402-4896/2005/T115/1026

Abstract

Hard x-ray absorption spectroscopy is combined with scanning microtomography to reconstruct full near edge spectra of an elemental species at each point on an arbitrary virtual section through a sample. These spectra reveal the local concentration of different chemical compounds of the absorbing element inside the sample and give insight into the oxidation state and the local projected free density of states. The method is implemented by combining a quick scanning monochromator and data acquisition system with a scanning microprobe setup based on refractive x-ray lenses. The full XANES spectra reconstructed at each point of the tomographic slice allow one to detect slight variations in concentration of the chemical compounds, such as Cu and Cu(I)2O.

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10.1238/Physica.Topical.115a01026