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Investigation of structural and electronic properties in Ru perovskite oxides by XAFS measurements

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Published under licence by IOP Publishing Ltd
, , Citation M Mizumaki et al 2005 Phys. Scr. 2005 513 DOI 10.1238/Physica.Topical.115a00513

1402-4896/2005/T115/513

Abstract

The electronic and structural properties of Ru oxides were investigated by utilizing x-ray absorption spectroscopy (XAS). We estimate the valence of Ru in perovskite ruthenium oxides by XAS measurements. XAS measurements were carried out at room temperature around Ru K-edge. The valence of Ru in A2(A = Ba, Sr)LnRuO6 and A(A = Ca, Ba, Sr)RuO3 was 4+. The valence of Ru in Ln3RuO7 was 5+. The valence of Ru in PbRuO3 showed an intermediate value between 4+ and 5+. We calculated XAS spectra around the Ru K-edge by FEFF 8.0. Theoretical calculation reproduced the experimental spectra. We analyzed XAS spectra and obtained information of local structure. The bond length between Ru and O was consistent with the results of neutron diffraction.

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10.1238/Physica.Topical.115a00513