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High-Speed Phase-Modulation Atomic Force Microscopy in Constant-Amplitude Mode Capable of Simultaneous Measurement of Topography and Energy Dissipation

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Published 18 July 2008 Copyright (c) 2008 The Japan Society of Applied Physics
, , Citation Yan Jun Li et al 2008 Jpn. J. Appl. Phys. 47 6121 DOI 10.1143/JJAP.47.6121

1347-4065/47/7S2/6121

Abstract

We have developed high-speed phase-modulation atomic force microscopy (PM-AFM) in a constant-amplitude (CA) mode. Using this imaging mode, we have theoretically demonstrated that energy dissipation due to tip–sample interaction can be obtained from the excitation amplitude of a cantilever. Moreover, we have found that the photothermal excitation method is better than the acoustic excitation method for cantilever oscillation in liquids. For the first time, we have demonstrated that a homebuilt high-speed PM-AFM in the CA mode has the capability to simultaneously measure the topography and energy dissipation with a material-specific contrast for a PS/PIB polymer-blend film.

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10.1143/JJAP.47.6121