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Dielectric Breakdown Strength of Grain-Oriented Bi4Ti3O12 Ceramics

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Copyright (c) 1992 The Japan Society of Applied Physics
, , Citation Kazuo Shoji Kazuo Shoji and Yasuo Uehara Yasuo Uehara 1992 Jpn. J. Appl. Phys. 31 3265 DOI 10.1143/JJAP.31.3265

1347-4065/31/9S/3265

Abstract

DC dielectric breakdown strength Eb of grain-oriented Bi4Ti3O12 ceramics fabricated by the hot-forging method and the cold-uniaxial pressing method has been studied. In the hot-forging sample with the X-ray orientation factor of 0.84, Eb was about 22 MV/m, when electric field was applied parallel to the pressing axis of the grain-oriented ceramics. On the other hand, Eb was about 16 MV/m, when the field was perpendicular to the pressing axis. It was found that grain orientation is effective in increasing Eb parallel to the pressing axis.

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10.1143/JJAP.31.3265