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405 nm Laser Thermal Lithography of 40 nm Pattern Using Super Resolution Organic Resist Material

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Published 27 November 2009 ©2009 The Japan Society of Applied Physics
, , Citation Yoshihisa Usami et al 2009 Appl. Phys. Express 2 126502 DOI 10.1143/APEX.2.126502

1882-0786/2/12/126502

Abstract

We have developed a high resolution resist for laser thermal lithography and a fabrication method for this resist. We designed a resist material which has specific desired properties. We aimed to raise the gasification temperature and achieve a sharply peaked temperature profile so that holes are formed only in the center of the laser spot. We were able to perform lithography with a half pitch of 40 nm. Furthermore, using the result of this lithography as a dry etching mask, we were able to perform dry etching on a number of materials, including SiO2 and sapphire.

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10.1143/APEX.2.126502