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Crystal growth, perfection, linear and nonlinear optical, photoconductivity, dielectric, thermal and laser damage threshold properties of 4-methylimidazolium picrate: an interesting organic crystal for photonic and optoelectronic devices

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Published 13 October 2016 © 2016 IOP Publishing Ltd
, , Citation K Rajesh et al 2016 Mater. Res. Express 3 106203 DOI 10.1088/2053-1591/3/10/106203

2053-1591/3/10/106203

Abstract

The 4-methylimidazolium picrate has been synthesized and characterized successfully. Single and powder x-ray diffraction studies were conducted which confirmed the crystal structure, and the value of the strain was calculated. The crystal perfection was determined by a HRXR diffractometer. The transmission spectrum exhibited a better transmittance of the crystal in the entire visible region with a lower cut-off wavelength of 209 nm. The linear absorption value was calculated by the optical limiting method. A birefringence study was also carried out. Second and third order nonlinear optical properties of the crystal were found by second harmonic generation and the z-scan technique. The crystals were also characterized by dielectric measurement and a photoconductivity analyzer to determine the dielectric property and the optical conductivity of the crystal. The laser damage threshold activity of the grown crystal was studied by a Q-switched Nd:YAG laser beam. Thermal studies established that the compound did not undergo a phase transition and was stable up to 240 °C.

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1. Introduction

Organic crystals provide an excellent nonlinear optical (NLO) property due to the presence of π-bonds which satisfy the requirements in the emerging laser technology [1, 2]. Many opto-electronic and photonic industries need a stronger material for laser fabrication with the desired NLO property [3]. Organic crystals have a large NLO coefficient compared to inorganic crystals.

Crystallization of more than one component into a new compound, forming a new co-crystal, is a well-known and broad research area involving, for example, active pharmaceutical ingredients and crystal engineering [4, 5]. 4-methylimidazole is an often used pharmaceutical intermediate [6]. Picric acid is one of the stronger organic acids and is well renowned for its proton donating property. Picric acid can be easily adopted as an organic acid in the synthesis of co-crystallized complexes with other ingredients [7]. The crystal structure and hydrogen bonding of 4-methylimidazolium picrate (4-MIP) were reported in the investigation made by Xue-gang et al [8].

In the present investigation we focus on the crystal growth and various characterizations made on 4-MIP. Single and powder x-ray diffraction (XRD), UV–vis spectroscopy, optical limiting (OL), photoluminescence (PL) and birefringence, photoconductivity, dielectric and thermal studies are carried out and discussed. Second harmonic generation (SHG), z-scan and laser damage threshold (LDT) studies are also conducted on the crystal, and the obtained results are discussed in detail.

2. Materials and method

2.1. Crystal growth

A 4-MIP single crystal was grown by a slow solvent evaporation technique using methanol as a solvent. The starting materials of 4-methylimidazole (98% of purity) and picric acid (99% of purity) were taken in an equimolar ratio. The reagents were dissolved in 95% of methanol solvent separately. Then the mixture was stirred for more than 2 h at room temperature and then filtered. The filtered pale yellow solution was kept in a beaker and allowed to evaporate in an air atmosphere for 2 weeks. Needle-shaped yellow seed crystals of 4-MIP were harvested. The seed crystals were carefully separated from the parental solution and purified by a successive recrystallization process. For further characterization, the bulk crystals were obtained after a period of 21 days and are shown in figure 1.

Figure 1.

Figure 1. Photograph of as grown 4-MIP crystal.

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3. Results and discussion

3.1. XRD studies

Single and powder XRD studies were carried out to confirm the crystal structure of the 4-MIP single crystal. Single crystal XRD studies showed that the lattice parameter values of the grown crystal were a = 9.305 Å, b = 9.431 Å and c = 15.189 Å and it was crystallized in a monoclinic crystal system with the centrosymmetric space group P21/c. These values are in good agreement with the reported values [8]. A powder XRD pattern of 4-MIP crystal was recorded over the range 10°–70° at a scan rate of 1°/min. The powder XRD pattern of the crystal is shown in figure 2. The PXRD peaks indexed and the cell parameter of the crystal were calculated. The cell parameter values of the grown 4-MIP crystal found from the single crystal XRD study are compared with the reported values and are shown in table 1.

Figure 2.

Figure 2. Powder XRD pattern of the 4-MIP crystal.

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Table 1.  Crystal structural data of the 4-MIP Crystal.

Cell parameters Single XRD-present investigation Reported values [8]
a (Å) 9.305 9.3079 (17)
b (Å) 9.431 9.4339 (17)
c (Å) 15.189 15.195 (3)
α = γ 90 90
β 107.628 107.835 (2)
Volume (Å)3 1269.9 1270.2 (4)
Crystal system Monoclinic Monoclinic
Space group P21/c P21/c
Z 4 4

The strain calculations of the crystal in the grain boundaries can be made from the powder XRD values by using the Hall–Williamson equation [9] given below:

where, β, θ and K are the full width at half maxima (FWHM) of the diffraction peak, Bragg diffraction angle and Scherrer constant, λ, τ and η are the wavelength of the x-rays, crystalline size and slope value respectively. The strain value was calculated from the slope value in the plot between β cos θ and sin θ, as shown in figure 3. The strain of the crystal was found to be 0.004 32 and the actual values are slightly different from the linear fit, which suggests that the crystal carries a minimum compressive strain.

Figure 3.

Figure 3. Strain curve.

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3.2. High resolution XRD study

The crystalline quality and perfection of the 4-MIP crystal was studied by high resolution XRD (HRXRD). The recorded diffraction curve of the 4-MIP crystal (figure 4) contains a sharp single peak without any satellite peaks which results in the crystal being completely free from any structural grain boundaries [10]. However, the parental solution was purified by the reflux method. Water molecules were distilled from the solution which yielded the presence of a single peak and the absence of impurities at the macroscopic level. This shows that the grown crystal has a good crystalline quality. The FWHM of the curve is 31 arc sec which is very close to an ideally perfect crystal [11]. The scattered intensity is high in the positive direction when compared to the negative direction. This demonstrates that the 4-MIP crystal contains more interstitial defects than vacancy defects [12]. The compressive stress and lattice parameter decrease due to these interstitial defects which leads to a high intensity and Bragg angle [13].

4. Linear optical studies

4.1. UV–visible study

The linear optical properties of the 4-MIP crystal were studied, giving useful information about UV and visible light. The transmission graph in figure 5(a) reveals that the grown crystal exhibits low transmittance in the UV region and high transmittance in the entire visible region. This property is one of the most highly advantageous in the field of opto-electronics for device fabrication [14]. The lower cut off wavelength is 209 nm and this kind of minimum lower cutoff wavelength is a desirable requirement for frequency doubling application using a solid state laser and diode [15].

Figure 4.

Figure 4. HRXRD curve of 4-MIP.

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Figure 5.

Figure 5. (a) UV–vis transmission curve; (b) Tauc's plot.

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The optical band gap energy (Eg) of the crystal was calculated from the absorption coefficient and it is found to be 4.37 eV, which is in good agreement with the value obtained from Tauc's plot in figure 5(b). One can easily find the Eg value by extrapolating the linear part in the Tauc's plot [16].

4.2. PL studies

The PL technique is one of the best and accurate methods for determining the optical quality as well as its excitation fine structure [17]. The PL emission spectrum was recorded using a Perkin Elmer PL unit at room temperature with a slit width of 10 nm in the wavelength range of 200–500 nm. The observed PL emission spectrum of the 4-MIP crystal is shown in figure 6. The spectrum contain an excitation peak at a wavelength of λex = 296 nm. A single high intense emission band and only one excitation state has been observed due to intermolecular interactions of lattice vibrations in the 4-MIP crystal. This shows the better optical and crystalline quality of the crystal.

Figure 6.

Figure 6. PL emission spectrum of the 4-MIP crystal.

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4.3. Optical limiting

Low power laser devices are widely used in various applications, such as optical switches and modulators [18]. The linear optical absorption coefficient value of the material was examined in an air atmosphere at room temperature by the OL method. The room temperature was nearly 25 °C.

The low intense laser light from the source was focused on the sample and the output power was measured using a power meter detector. This process was repeated for various input power values and the corresponding output values obtained from the power meter were recorded. A similar procedure was followed to record the output of the laser without the incident of any material. A graph was drawn between the input and output power and is shown in figure 7.

Figure 7.

Figure 7. OL plot of 4-MIP.

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The linear absorption α can be measured by using the following relation:

where, P is the output power of the laser after hitting the sample, Po is the output power for the direct laser source without hitting the sample and L is the focal length. The linear absorption of the 4-MIP crystal was found to be 2.97 J cm−1.

4.4. Birefringence study

A birefringence study is another method to find the optical perfection in the crystal. The homogeneity and defects in the grown crystals can be analyzed by a birefringence study [19]. The modified channel spectrum method is used for quantative assessment for the optical homogeneity of the grown crystal. When highly intense light is passed through the crystal, the ordinary and extraordinary waves are perpendicular to each other. The phase difference is 180° between these two polarized components of wavelength. The birefringence values have been calculated by finding the absolute fringe orders using the relation:

where, λ is the wavelength, t is the thickness of the crystal and K is the order of the fringe. Figure 8 shows the variation of the birefringence with the wavelength. From the graph, it can be seen that the value of the birefringence lies in between 0.032–0.057 in the wavelength range 320 nm–610 nm. The minimum variation in the birefringence over a wide range of wavelength indicates that the crystal is suitable material for harmonic generation device fabrication [20]. The obtained values were found to be positive integer and increased with increasing wavelength, which illustrates that the grown 4-MIP crystal possesses a positive dispersion of birefringence [21]. The plot shows that some distortion from the linearity is present in the plot. A slight dispersion evident in the birefringence can be very helpful in the frequency conversion process, such as second and third harmonic generations [22].

Figure 8.

Figure 8. Birefringence plot of 4-MIP crystal.

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5. NLO studies

5.1. Second harmonic generation efficiency

The NLO property of the grown crystal is characterized by the Kurtz–Perry powder technique with the use of a Nd:YAG laser light [23]. The standard SHG crystals of KDP and urea have been used as the reference materials for this study. The output SHG signal of 43.9 mV for the 4-MIP crystal was obtained for an input energy of 5 mJ/pulse, whereas the KDP and urea crystals gave an output of 18.4 mV and 25.9 mV respectively for the same input signal . This confirms that the SHG efficiency of the 4-MIP crystal is 2.38 times that of the KDP crystal and 1.70 times that of urea. This is the main advantage of this crystal and it is suitable for device fabrication. Comparison of the SHG value of the title compound along with KDP and urea are shown in table 2.

Table 2.  SHG efficiency comparison.

Input power SHG output in mV
5 mJ/pulse 4-MIP KDP Urea
  43.9 18.4 25.9

5.2. Third order NLO studies: z-scan technique

Third harmonic generation is one of the best methods to prove the higher order NLO property. This will fulfill the requirements in technological applications of optical information processing and broadband communications in optical amplification, switching and image processing [24].

Another advantageous technique for measuring the third order harmonic nonlinear efficiency is the single beam z-scan technique. It is a simple, highly sensitive and accurate method to determine the nonlinear refractive index n2 (real part) and non-linear absorption coefficient β (imaginary part) of the third order generation [25].

A Q-switched Nd:YAG laser of 1064 nm wavelength is used for this experiment. The obtained results of the z-scan curves in open and closed aperture modes are shown in figures 9 and 10.

Figure 9.

Figure 9. Open aperture Z-scan curve.

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Figure 10.

Figure 10. Closed aperture z-scan curve.

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The nonlinear refractive index can be obtained by the relation given by,

where K is the wave number (K = 2π/λ) and I0 is the intensity of the laser beam at the focus (Z = 0), Leff is the effective thickness of the sample, L is the thickness of the sample and α is the linear absorption. From the open aperture curve line, the nonlinear absorption coefficient (β) was estimated by,

where ΔT is the peak value at the open aperture data. The absolute value of the optical susceptibility (χ3) was calculated by using the equation,

where Re and Im are the real part and imaginary part of the optical susceptibility. From the z-scan data, the calculated value of (χ3) is 2.353 × 10−3 esu and the nonlinear refractive index (n2) is 4.898 × 10−7 and it is due to the π electron cloud movement from the donor to the acceptor which makes the molecules highly polarized [26].

6. LDT studies

The threshold stability of the crystal against the laser is proved by the LDT technique. The LDT value of 4-MIP was examined by a high intensity Q-switched Nd:YAG laser with a wavelength of 1064 nm and a pulse width of 10 ns. The repetition rate of the LDT measurement was 10 Hz. The thickness of the sample was kept as 1.1 mm and the focal length of the laser beam was 1 mm.

The observed LDT values of the crystal were found to be 6.45 GW cm−2. Hence, the crystal has a high LDT value; 4-MIP crystal can be used for high power frequency conversion applications [27].

7. Photoconductivity studies

Photoconductivity studies were carried out for the 4-MIP crystal using a Keithley 485 picoammeter at room temperature (∼28 °C). The dark current (Id) of the sample was measured using a DC power supply and picoammeter. Figure 11 shows the variation of photocurrent and dark current as a function of the applied field.

Figure 11.

Figure 11. Photoconductivity plot of 4-MIP.

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It is observed from the plot that the photo current (Ip) and dark current (Id) of the sample increase linearly with the applied field, and the photo current is always higher than the dark current. This phenomenon is known as positive photoconductivity [28]. It can be concluded that under a high exposure of light, the 4-MIP crystal exhibits positive photoconductivity.

8. Thermal analysis

Thermogravimetric (TG) and differential thermal analysis (DTA) were used to determine the thermal stability of the grown 4-MIP crystal by using a NETZSCH STA 409 CCD thermal analyzer. The experiment extended to the range from 25 °C–600 °C at a heating rate of 20 °C min−1 in a nitrogen atmosphere. Figure 12 illustrates the TG and DTA curves. The DTA curve implies that the material undergoes an endothermic transition of two significant peaks at 184 °C and 357 °C where the melting begins. The first endothermic peak represents the temperature at which the melting terminates, which corresponds to its melting point.

Figure 12.

Figure 12. TG and DTA curves of the 4-MIP crystal.

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Normally, the melting area of the trace leads to a vertical line. The next peak may be assigned to solvent molecule evaporation. The TG curve of this sample indicates that the grown crystal is stable nearer to 240 °C and above this temperature the weight loss is not due to the self degradation of 4-MIP but merely due to its evaporation after its melting. The sharpness of the endothermic peak shows a good degree of crystallinity of the crystal and demonstrates that it is thermodynamically stable in all atmospheres at room temperature [29].

9. Dielectric measurements

The dielectric study of the 4-MIP single crystal was carried out using the HIOKI 3532-50 LCRHITESTER instrument. The capacitance values for the grown 4-MIP crystal are found for frequencies varying from 50 Hz–5 MHz at different temperature ranges. The rectangular shaped crystal with an area thickness of 1.94 mm is used for the dielectric studies. The dielectric constant is calculated using the formula

where C is the capacitance value, t is the thickness of the crystal, A is the area of the crystal, and ε0 is the absolute permittivity in free space. The dependence of the dielectric constant and dielectric loss on the log frequency of the applied AC voltage was studied in different temperature ranges. Figures 13 and 14 show the variation of the dielectric constant (εr) and dielectric loss with the log frequency at different temperature ranges. The dielectric behavior of the material is described in two frequency intervals—first in the lower frequency range and second in the higher frequency range.

Figure 13.

Figure 13. Dielectric constant versus frequency.

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Figure 14.

Figure 14. Dielectric loss versus frequency.

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Both the dielectric constant and dielectric loss decrease with increasing frequency. It is also found that the dielectric constant and dielectric loss change with temperature at low frequencies. It shows that both the dielectric constant and loss are dependent on temperature in the lower frequency range [30]. In the higher frequency region, the value of the dielectric constant almost attains saturation at all temperatures. In the higher frequency range, it is clear that the dielectric constant and loss of the material is strongly independent of temperature. The dependence of temperature is almost nonexistent in a higher frequency range.

10. Conclusion

An organic NLO single crystal of 4-MIP was grown by a slow solvent evaporation method. Single and powder XRD studies were carried out and the structure of the crystal was confirmed with the reported values. The 4-MIP crystal belongs to the monoclinic crystal system with the space group P21/c. The crystal possesses minimum compressive strain in the crystal boundary. HRXRD measurement was carried out and it was found that the crystal is totally free from any structural defects and dislocation in the grain boundaries. The PL emission spectrum revealed the optical perfection of the crystal with only one excitation peak. The crystal possesses more than 80% transmittance and has very good optical quality in the entire visible region with the lower cut-off wavelength of 209 nm. The optical band gap energy was calculated as 4.37 eV. The linear absorption coefficient of the 4-MIP crystal was found to be 2.97 J cm−1. The crystal obtained a very good birefringence in the visible region and it was found that birefringence is dependent of wavelength. Both the second and third harmonic generation efficiency of the crystal was found and the SHG efficiency of the 4-MIP crystal is more than that of a standard KDP and urea crystal. A photoconductivity study has revealed that the crystal possesses positive photoconductivity material. TG and DTA analysis confirmed that the crystal is thermally stable up to 240 °C. The stability of the crystal against the intense laser power was measured using LDT and it was found to be 6.45 GW cm−2. Both the dielectric constant and dielectric loss decreased as the frequency increased. All the results obtained from various characterization techniques for the 4-MIP crystal proved that the 4-MIP single crystal is a material well-suited for all photonic and optoelectronic application, and it was also found that this crystal is the best candidate for both low and high power laser operations.

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10.1088/2053-1591/3/10/106203