Abstract
Thin films quite often have different properties from the bulk. In the case of polyvinyl acetate, it is known that glass transition takes place at around room temperature (∼30 °C), and the thermal expansion coefficient is well determined for the bulk. However, with a ∼0.1 micron thin film, such measurements are not generally easy. The present paper reports the results of in-situ X-ray reflectometry, which is extremely sensitive to slight changes in layer thickness. It was found that thickness increases from 968 to 985 Å when the temperature is scanned from 10 to 55 °C, but the slope changes from 0.22 to 0.72 Å/ °C at around 35 °C. As the thickness change is due to thermal expansion, it is possible to discuss the mechanical properties below and above the transition temperature.
Export citation and abstract BibTeX RIS