Abstract
Recent advances in theoretical nonlinear optics have enhanced our understanding regarding the origin of the higher harmonic generation in particular interpreting the higher harmonic intensity data from nonlinear spectroscopy. In this work we show that the atomic bond orientation at the surface as well as the bulk of an inversion symmetric material e.g. Silicon (111) facet can be determined from nonlinear spectroscopy alone without the need to apply the conventional X-Ray diffraction method. Our simulation shows that nonlinear spectroscopy data interpreted using bond models can reliably determine atomic orientation almost in a direct way because the model is based on a very simple assumption that the radiations are created from charges along the atomic bonds. In addition we present a brief description of possible application to use nonlinear spectroscopy as an environmental sensor.
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