Abstract
A thin film of Tetraphenyl-butadiene (TPB) deposited onto the surface delimiting the active volume of the detector and/or onto the photosensor's optical window is the most common solution to down convert argon VUV scintillation light in current and planned liquid argon based experiments for dark matter searches and neutrino physics. Characterization of the main features of TPB coatings on different, commonly used substrates is reported, as a result of measurements at the specialized optical metrology labs of ENEA and University of Tor Vergata. Measured features include TPB emission spectra with lineshape and relative intensity variation recorded as a function of the film thickness and for the first time down to LAr temperature, as well as optical reflectance and transmittance spectra of the TPB coated substrates in the wavelength range of the TPB emission.