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Radiation damage caused by cold neutrons in boron doped CMOS active pixel sensors

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Published 24 May 2017 © 2017 IOP Publishing Ltd and Sissa Medialab srl
, , International Workshop on Semiconductor Pixel Detectors for Particles and Imaging (Pixel 2016) Citation B. Linnik et al 2017 JINST 12 C05011 DOI 10.1088/1748-0221/12/05/C05011

1748-0221/12/05/C05011

Abstract

CMOS Monolithic Active Pixel Sensors (MAPS) are considered as an emerging technology in the field of charged particle tracking. They will be used in the vertex detectors of experiments like STAR, CBM and ALICE and are considered for the ILC and the tracker of ATLAS. In those applications, the sensors are exposed to sizeable radiation doses. While the tolerance of MAPS to ionizing radiation and fast hadrons is well known, the damage caused by low energy neutrons was not studied so far. Those slow neutrons may initiate nuclear fission of 10B dopants found in the B-doped silicon active medium of MAPS. This effect was expected to create an unknown amount of radiation damage beyond the predictions of the NIEL (Non Ionizing Energy Loss) model for pure silicon. We estimate the impact of this effect by calculating the additional NIEL created by this fission. Moreover, we show first measured data for CMOS sensors which were irradiated with cold neutrons. The empirical results contradict the prediction of the updated NIEL model both, qualitatively and quantitatively: the sensors irradiated with slow neutrons show an unexpected and strong acceptor removal, which is not observed in sensors irradiated with MeV neutrons.

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10.1088/1748-0221/12/05/C05011