Abstract
A TDS is a well-known device for the characterization of the longitudinal properties of an electron bunch in a linear accelerator. So far, the correlation of the slice properties in the horizontal/vertical planes of the electron bunch distribution has been characterized by using a TDS system deflecting in the vertical/horizontal directions respectively and analysing the image on a subsequent screen. Recently, an innovative design for a TDS structure has been proposed, which includes the possibility of continuously varying the angle of the transverse streaking field inside a TDS structure. This allows the beam distribution to be characterized in all transverse directions. By collecting measurements of bunches streaked at different angles and combining them using tomographic techniques, it is possible to retrieve 3D distributions of the charge density. In this paper, a method is proposed and simulation results are presented to show the feasibility of such an approach at the upcoming accelerator R&D facility, SINBAD, at DESY.
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