Abstract
YBCO-BYTO6% and YBCO-BZO10% YBa2Cu3O7-d-Ba2YTaO6 6% (YBCO-BYTO6%) and YBa2Cu3O7--BaZrO3 10% (YBCO-BZO 10%) nanostructured films were grown by the Chemical Solution Deposition method, and compared with YBCO pure films. Films were deposited on YSZ substrates, with Ce0.9Zr0.1O2 and Ce0.6Zr0.4O2 buffer layers. They were characterized by GADDS X-ray diffraction, scanning electron microscopy (SEM) and inductive (SQUID) measurements of the critical temperature (Tc) and critical current density (Jc). It was found that YBCO-BZO10% films presented better superconducting properties (Tc=89.2K and Jc=1.3MA/cm2), probably due to an enhanced pinning force, originated by BZO nanoparticles. Additionally, it was found that these films have lower reactivity with the buffer layer.
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