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Characterization of delta-doped diamond samples with a planar capacitor

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Published under licence by IOP Publishing Ltd
, , Citation V V Vitko et al 2016 J. Phys.: Conf. Ser. 769 012092 DOI 10.1088/1742-6596/769/1/012092

1742-6596/769/1/012092

Abstract

The method for characterization of delta-doped diamonds is developed based on the measurement of a planar capacitor. Theoretical model for calculation of the product of carrier density and carrier mobility is obtained. Theoretical model verified by the experiment. The experimental value of the product of carrier density and carrier mobility was 6·1014 1/V·s·m.

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10.1088/1742-6596/769/1/012092