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Paper The following article is Open access

Photoelectrochemical corrosion of GaN-based p-n structures

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Published under licence by IOP Publishing Ltd
, , Citation A D Fomichev et al 2016 J. Phys.: Conf. Ser. 741 012049 DOI 10.1088/1742-6596/741/1/012049

1742-6596/741/1/012049

Abstract

Direct water photoelectrolysis using III-N materials is a promising way for hydrogen production. GaN/AlGaN based p-n structures were used in a photoelectrochemical process to investigate the material etching (corrosion) in an electrolyte. At the beginning, the corrosion performs through the top p-type layers via channels associated with threading defects and can penetrate deep into the structure. Then, the corrosion process occurs in lateral direction in n- type layers forming voids and cavities in the structure. The lateral etching is due to net positive charges at the AlGaN/GaN interfaces arising because of spontaneous and piezoelectric polarization in the structure and positively charged ionized donors in the space charge region of the p-n junction.

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10.1088/1742-6596/741/1/012049