Abstract
Fabrication and study of specialized single nanowhisker probes are performed for high-precision investigation of elements such as nanospheres and nanorods using the atomic force microscopy. It was found that single nanowhisker probe significantly increases the resolution and contrast of images obtained in the semi-contact mode. Furthermore, the roughness analysis and adhesion forces are investigated in contact mode to comprehensively characterize properties of nanospherical and nanorod electronic structures.
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