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Paper The following article is Open access

Local flux intrusion in HTS annuli during pulsed field magnetization

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Published under licence by IOP Publishing Ltd
, , Citation V S Korotkov et al 2016 J. Phys.: Conf. Ser. 695 012007 DOI 10.1088/1742-6596/695/1/012007

1742-6596/695/1/012007

Abstract

During pulsed field magnetization of melt-grown HTS flux jumps can occur and the shielding current falls by 10-20 times. As the duration of pulse is shorter than the temperature relaxation time (<< 1 s), the circular current remains small during the field falling. The residual trapped field in the hole of the annulus has a direction opposite to that of the pulsed field. Small circular current and high critical current density are explained by the fact that flux moves through narrow regions of the annulus body. The angle of the sector with "soft flux" (i.e. a low Jc region) is estimated to be ∼ 7 deg.

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10.1088/1742-6596/695/1/012007