High repetition rate and low energy femtosecond laser ablation coupled to ICPMS detection: a new analytical approach for trace element determination in solid samples

A low energy and high repetition rate infrared femtosecond laser system was developed for direct trace elements analysis by laser ablation/ICPMS. This system provides improved analytical performances in terms of limits of detection, repeatability, elemental fractionation and depth profile analysis in comparison to conventional nanosecond UV laser ablation used so far in analytical chemistry. Preliminary results show that limits of detection are improved by more than one order of magnitude and the elemental fractionation reduced to negligible values. In addition, depth profile resolution better than 20 nm are easily achievable on a Cr-Ni multilayer material which opens new fields of application in surface analysis.