Depth profiling of magnetic and atomic structures of ultrathin films by depth-resolved XMCD and XAFS techniques with a sub-nm depth resolution

Recent progresses in the depth-resolved X-ray magnetic circular dichroism (XMCD) and X-ray absorption fine structure (XAFS) techniques are presented. The depth-resolved atomic and magnetic structures of Co films grown on Ru(0001) was investigated by using the depth-resolved XMCD and extended X-ray absorption fine structure EXAFS. The three-dimensional magnetic structure of a micro-patterned Fe/Ni/Cu(100) film was studied by combining the depth-resolved XMCD with the X-ray microbeam. The technique was also applied to Co thin films covered with a relatively thick Mo overlayer, in order to demonstrate the possibility to investigate ex-situ samples with a protection layer.