Abstract
We have studied thin layered Au/Pd/alumina/Cu-Al system by means of synchrotron radiation photoelectron spectroscopy (SRPES), X-ray photoelectron spectroscopy (XPS) and low energy electron diffraction (LEED). Ordered 0.8 nm thick alumina film was prepared by the controlled oxidation of the single-crystalline Cu-9at.%Al(111) support. The Pd and Au layers were prepared afterwards by a step-by-step deposition at room temperature. LEED measurement itself did not confirm epitaxial growth of the metal overlayers. They exhibited a pseudo layer-by-layer growth mode confirmed by work function measurements and the Monte Carlo simulation of the copper XPS peaks attenuation.
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