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The following article is Open access

The STM view of the initial stages of polycrystalline Ag film formation

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Published 26 March 2007 Published under licence by IOP Publishing Ltd
, , Citation Celia Polop et al 2007 New J. Phys. 9 74 DOI 10.1088/1367-2630/9/3/074

1367-2630/9/3/74

Abstract

The growth of Ag thin films deposited at 300 K on amorphised Si surfaces under ultra high vacuum conditions is investigated by in situ scanning tunnelling microscopy. The analysis of film morphology as a function of film thickness together with additional annealing experiments allow a quite complete picture of the film formation processes to be obtained.

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